接触模式 也是用于表征形貌的手段，但是并没有轻敲模式常用，因为样品表面的脏东西可能会被探针划走，造成假象。 该模式可以定量的控制探针施加的力，研究力对样品的影响。 PFM,CAFM 都是基于接触模式的。 可以通过下面的链接大概了解原理和机器结构. 中文版 Atomic Force Microscopy Explained — AFM Modes and Theory - Nanosurf. 英文版 AFM Theory — Contact Modes - Nanosurf. 230901 本文更新：轻敲模式和接触模式对比. 在tapping模式笔记中有详细 …

Contact mode AFM is more suitable for beginners than tapping mode. There are additional parameters to control connected to the AFM cantilever’s oscillatory motion. Lateral friction forces can be detected when measuring in constant contact with the sample surface.

2012年5月18日 · Contact mode is not only the easiest AFM mode to understand but also the fundamental basis of additional modes as Scanning Capacitance Mode (SCM), Scanning Spreading Resistance Mode (SSRM), etc. A typical AFM cantilever is shown in figure 3.

• In FMM mode, the tip is scanned in contact with the sample, and the z feedback loop maintains a constant cantilever deflection (as for constant-force mode AFM). • A periodic vertical oscillation signal is applied to either the tip or the sample.

2019年12月15日 · 根据针尖与试样表面相互作用力的变化，AFM主要有3种操作模式：接触模式(contact mode), 非接触模式 (non-contact mode)和敲击模式(tapping mode)。 接触模式（Contact Mode）：AFM最直接的成像模式。在整个扫描成像过程之中，探针针尖始终与样品表面保持接触，而相互作用力 ...

AFM测试 原子力显微镜 有三种基本成像模式，它们分别是接触式(Contact mode)、非接触式(non-contact mode)、轻敲式(tapping mode) 1、接触式. 接触式AFM是一个排斥性的模式，探针尖端和样品做柔软性的“实际接触”，当针尖轻轻扫过样品表面时，接触的力量引起悬臂弯曲 ...

Contact mode is a standard imaging mode of Atomic Force Microscopy (AFM) that can obtain topographic information on a wide range of sample types. In contact mode, feedback is typically obtained through cantilever bending, which employs a …

Contact Mode AFM, also known as Constant Force Mode, is one of the more commonly used imaging modes in AFM. It is often used in imaging hard materials, in some electrical techniques,

Static mode, or contact mode, is the original and simplest mode to operate an AFM. In this mode, the probe is in continuous contact with the sample while the probe raster scans the surface. In other words, the probe "drags" across the sample.

There are 3 primary modes of AFM: In Contact AFM, the tip is in perpetual contact with the sample. The tip is attached to the end of a cantilever with a low spring constant—lower than the effective spring constant of the force holding the atoms of most solids together.