The discipline involves the identification and categorisation of various defect patterns on wafer maps, often using advanced machine learning and deep learning techniques. By deciphering complex ...

This project focuses on detecting potential scratch defects on silicon wafer dies using deep learning techniques. It simulates a real-world semiconductor manufacturing scenario where identifying ...

SiC trails behind the mature silicon industry in adopting advanced analytics and streamlined yield management systems (YMS).

Abstract: This paper describes an AI-driven automated system that leverages Convolutional Neural networks (CNNs) for real-time wafer map defect recognition. The proposed framework integrates data ...

Abstract: A method for modeling the variations in defect levels in circuits produced on modern integrated circuit manufacturing lines is described in this paper. The effects on defect and fault ...

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桥接缺陷检测（Bridge defect detection） · 图片中显示了一个明显的桥接缺陷，表现为两个相邻的金属互连层之间形成了一个短接。 深圳方泰公司，是专业的半导体陶瓷部件服务商，20年半导体行业经验的团队，为用户提供陶瓷真空吸盘、陶瓷手臂、陶瓷气浮导轨 ...

Two case studies show how advanced high-resolution 3D XRM can detect and visualize defects in Wafer Level Chip Scale Packages (WLCSP) containing RDL and Cu pillar microbumps.

Changing pay equity legislation is expected to save the Government about $2.7 billion a year. Those savings were outlined in the Budget today, with Finance Minister Nicola Willis saying the money was ...