Circuit and 3D technology computer aided design mixed-mode simulations show that the single event upset vulnerability of 130- and 90-nm hardened latches to low linear energy transfer (LET) particles ...

Heavy ion-induced digital single-event transients in deep submicron Processes Abstract: Single-event transients (SETs) in digital circuits/processes are examined. SETs appear to substantially mitigate ...

Fans cheer in the bottom of the 10th inning during an NCAA softball Women's College World Series elimination game between Mississippi and Oregon, Friday, May 30, 2025 in Oklahoma City.

DeepSeek-R1-0528-Qwen3-8B also nearly matches Microsoft’s recently released Phi 4 reasoning plus model on another math skills test, HMMT.. So-called distilled models like DeepSeek-R1-0528-Qwen3 ...