The CX23 allows users to see more with a greater field number than standard microscopes in this class. Outstanding Image Flatness Plan Achromat Objectives The CX23 features plan achromat ...

The JEOL JSM-6500F is a Field Emission Scanning Electron Microscope (FESEM) w/Electron Beam Lithography attachment, and Nanometer Pattern Generation Systems (NPGS). It offers high resolution images of ...

Researchers have developed a method to improve the resolution of a conventional wide-field optical microscope. Scattered light usually reduces the resolution of conventional optical microscopes.