The JEOL JSM-6500F is a Field Emission Scanning Electron Microscope (FESEM) w/Electron Beam Lithography attachment, and Nanometer Pattern Generation Systems (NPGS). It offers high resolution images of ...

The CX23 allows users to see more with a greater field number than standard microscopes in this class. Outstanding Image Flatness Plan Achromat Objectives The CX23 features plan achromat ...

The field emission scanning electron microscope additionally supports root-cause failure analysis activities for the power generation, aerospace and transportation industries. Engineers will use ...

A portable holographic field microscope developed by University of Connecticut optical engineers could provide medical professionals with a fast and reliable new tool for the identification of ...

Indeed, there has been an increasing number of inquiries about the digital transformation of microscopes that changes analog optical microscopes to digital microscope systems. MOPIC Light Field 3D ...

"We wanted to know if we could put these portable field microscopes into the hands of individuals who would use them in day-to-day settings, and whether they would be effective. We wanted to see ...

Researchers have developed a method to improve the resolution of a conventional wide-field optical microscope. Scattered light usually reduces the resolution of conventional optical microscopes.

JEOL announces the release of a new cold field emission cryo-electron microscope (cryo-EM), the CRYO ARM™ 300 II (JEM-3300), to be ... Improved hardware stability for high-quality image acquisition In ...

"We wanted to know if we could put these portable field microscopes into the hands of individuals who would use them in day-to-day settings, and whether they would be effective. We wanted to see ...