资讯

C&EN27 天
Thickness-Dependent Charge Storage Dynamics in Polydithienothiophene Thin Films for Next ...
Photovoltaic Metrology Section, Advanced Material & Device Metrology Division, CSIR-National Physical Laboratory, Dr. K. S. Krishnan Marg, New Delhi 110012, India ...
C&EN29 天
AC Electrical Properties of a NiFe-Layered Double Hydroxide with an Exceptionally Low ...
Department of Nanoscience and Nanotechnology, School of Integrated Innovative Technology, King Mongkut’s Institute of Technology Ladkrabang, Bangkok 10520, Thailand Advanced Materials Research Unit, ...