We investigated the nitrogen defects formed in graphene grown on the Pt(111) surface using pyridine precursors. In this study, we used scanning tunneling microscopy (STM) and atomic force microscopy ...

Abstract: We present new insights into the modeling of the microcantilever in dynamic mode atomic force microscopy and outline a novel high-bandwidth tip-sample force estimation technique for the ...

Find more information on the Altmetric Attention Score and how the score is calculated. Motivated by reports of low-level DNA contamination in popular commercial DNA purification kits, we employed a ...

Abstract: This paper reports the integration of both electrical and thermal elements into the free end of an atomic-force microscope cantilever, where the electrode and heater-thermometer are ...