This article will explore various aspects of failure analysis methodologies in semiconductor and electronic device manufacturing, with a particular focus on the application of atomic force microscopy ...

Featuring a new ergonomic design and improved electronics, this scientific-grade microscope delivers atomic-scale resolution at a remarkably affordable price. The 5420 offers a simple cost ...

† Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, 230026, P. R. China ‡ i-Lab, Suzhou Institute of Nano-Tech and Nano-Bionics, ...

scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM ...

If you would like to learn more about the IAEA’s work, sign up for our weekly updates containing our most important news, multimedia and more. This publication states the fundamental safety objective ...