Using these cantilevers assures accurate measurement of both roughness and mechanical ... enabling chip stacking and wafer-on-wafer bonding. AFM is very useful here when dealing with many wafer ...

The roughness for the full image is already calculated and displayed, but a mask can be made to exclude certain areas from the roughness in the image. Click on the Mask Make button. This will make a ...

full grid or wafer mapping support, tip-centering, and image-placement precision within tens of nanometers Easy and simple setup to align sample to probe and make alignment corrections to AFM ...

Park Systems introduces Park FX300 for 300 mm wafer analysis, alongside Park FX200 IR and FX300 IR, which integrate infrared (IR) spectroscopy, pushing the boundaries of large-sample AFM technology.