a hydrogen-terminated silicon surface. A procedure to obtain a passivated hydrogen-functionalized tip is defined and evolution of atomic force microscopy images at different tip elevations are shown.

In semiconductor and electronic device manufacturing, where detailed insights into nanoscale surface features are essential, ...

The Park FX200 offers exceptional AFM precision for 200 mm samples, enabling high-resolution imaging and automated analysis ...

A comprehensive examination of oxide production on a silicon surface with platinum-coated while scratching when given a tip bias and material removal using a diamond tip, employing AFM, is presented ...

To draw nanopatterns onto a silicon substrate, a Park NX10 AFM was utilized for AFM nanolithography. LFM imaging was performed after the lithography process to verify the successful fabrication of the ...

Scanning across the surface, the sharp tip follows the bumps ... hundred frames in the same time as it would take a conventional AFM to capture a single frame" says Vicary. "With uncoated silicon ...

(Image: Nanosurf) In C-AFM, a conductive AFM probe, typically made of silicon or silicon nitride and coated with a thin metal layer (e.g., gold or platinum), is used to scan the sample surface. The ...

What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...

A new dynamic AFM sensor uses a U-shaped, silicon cantilever connected to a ... or electrical phenomenon between the tip and the surface. To avoid leakage currents through the buffer, we ...

The researchers then put the silicon carbide in an ultrahigh-vacuum chamber before studying its surface properties using an atomic–force microscope (AFM). The team measured the friction on the surface ...