The smooth (Smo) silicon surface and photoetched regular (Regu ... Surface roughness parameters (Sa, Sq, and Sz) were detected using an atomic force microscope (AFM; 5500, Agilent, United States) in a ...

The thickness of the surface features can be estimated from the peak–valley distance after image flattening. In addition, a series of AFM images was also recorded for the human cornea and the ...

Abstract: An experimental study was conducted to investigate the feasibility of fabricating relatively long nanochannels on hard and brittle silicon dioxide surface using atomic force microscopy (AFM) ...

Abstract: The Atomic Force Microscopy (AFM)-based repeatable nanomachining for nanochannels on bare silicon surface is investigated experimentally. A relationship between the normal force applied on ...

A comprehensive examination of oxide production on a silicon surface with platinum-coated while scratching when given a tip bias and material removal using a diamond tip, employing AFM, is presented ...

This probe is used for imaging the nanostructure surface of biomolecules. The material of the probe influences the function of AFM. For instance, a silicon probe can be made sharper but wears off ...

a hydrogen-terminated silicon surface. A procedure to obtain a passivated hydrogen-functionalized tip is defined and evolution of atomic force microscopy images at different tip elevations are shown.

Etched surface of the silicon wafer was found emitting red luminescence when exposed to ultra violet (UV) light. XRD and Atomic Force Microscopy of the etched samples were carried out to study the ...

Find more information on the Altmetric Attention Score and how the score is calculated. In the present work, the individual nanoparticles have been manipulated on a silicon surface, using atomic force ...