Discover everything there is to know about Reverse Tip Sample Scanning Probe Microscopy (RTS SPM) and its main applications.

Recently, a team of researchers led by Ayhan Yurtsever, Takeshi Fukuma, and Linhao Sun from Kanazawa University, in collaboration with Yuhei Hayamizu at the Institute of Science Tokyo and Mehmet ...

Use precise geolocation data and actively scan device characteristics for identification. This is done to store and access ...

KANAZAWA, Japan, June 11, 2025 /PRNewswire/ — Researchers at the Nano Life Science Institute (WPI-NanoLSI), Kanazawa University observe and model how the enzyme ADAR1 interacts with double-stranded ...

This handbook illustrates the wide variety of operating modes available on Bruker AFMs, going well beyond the standard high‑resolution topographic imaging capabilities of AFM. The modes are broken ...

this new small-footprint AFM delivers wider access to Bruker’s exclusive PeakForce Tapping® technology and over 50 AFM modes. The upgradability and enhanced ease of use of Dimension Nexus provides an ...

This is the GitHub repository for AFMDAQ Visualizer, a project with the objective of acquiring and processing raw AFM data to plot variables of interest related to the type of microscopy.

The introduction of electrical Atomic Force Microscopy (AFM) modes has transformed the field of nanoscale analysis. These methods have unlocked novel opportunities for measuring electrical properties ...

Characterize much more than just nanoscale topographic features. Atomic force microscopy is an umbrella term comprising dozens of complementary “modes” of operation. These different modes can not only ...

Abstract: Control design and improvement of dynamic atomic force microscopy (AFM) modes and development of new dynamic modes are among the central problems of AFM theory and practice. Proper design ...