SiC trails behind the mature silicon industry in adopting advanced analytics and streamlined yield management systems (YMS).

Materials Science and Engineering, Penn State University, University Park, Pennsylvania 16802, United States Department of Chemistry, Penn State University, University Park, Pennsylvania 16802, United ...

Abstract: This paper describes an AI-driven automated system that leverages Convolutional Neural networks (CNNs) for real-time wafer map defect recognition. The proposed framework integrates data ...

To address this, we evaluate the state-of-the-art You Only Look Once (YOLO) architecture to accurately locate and classify wafer map defects. Experimental results obtained on 19200 wafer maps show ...

桥接缺陷检测（Bridge defect detection） · 图片中显示了一个明显的桥接缺陷，表现为两个相邻的金属互连层之间形成了一个短接。 深圳方泰公司，是专业的半导体陶瓷部件服务商，20年半导体行业经验的团队，为用户提供陶瓷真空吸盘、陶瓷手臂、陶瓷气浮导轨 ...