资讯

EDN22 小时
Unlocking compound semiconductor manufacturing’s potential requires yield management
SiC trails behind the mature silicon industry in adopting advanced analytics and streamlined yield management systems (YMS).
IEEE4 天
Similarity Searching for Defective Wafer Bin Maps in Semiconductor Manufacturing
Abstract: Because high-dimensional wafer bin maps (WBMs) cause various features, it is difficult to search the similarity among WBMs via conventional pattern recognition methods. This study develops a ...
C&EN5 天
Observation of Rich Defect Dynamics in Monolayer MoS
Materials Science and Engineering, Penn State University, University Park, Pennsylvania 16802, United States Department of Chemistry, Penn State University, University Park, Pennsylvania 16802, United ...