The scanning electron microscope (SEM) is a powerful tool for studying surface changes and fracture mechanics in tensile ...

Surface Sensitive AFM-IR mode (SSM) is a recently developed Bruker proprietary mode that aims to isolate and only measure the top layer of a sample by limiting signal contributions from sub ...

Use precise geolocation data and actively scan device characteristics for identification. This is done to store and access information on a device and to provide personalised ads and content, ad and ...

Figure 4A shows the AFM height images and compares the 15 W ppC:H 800 nm-thick film deposited on BN and on polished Si. The surface of the ppC:H/BN sample is very rough, with the surface profile ...

“I especially appreciate the compact and upgradable nature of the Dimension Nexus large-sample AFM and the fact that it can perform the latest PeakForce Tapping modes. I can see this being a real ...

Nagayama, K. and Hirooka, Y. (2025) Changes in the Mechanical Environment of the Nucleus with Cell Crowding and Its Effects on DNA Damage Resistance. Journal of Biosciences and Medicines, 13, 230-242.

An interview on how advanced techniques can be used to enhance silk fibroin and chitosan for drug delivery applications.

Department of Physics, University of Basel, Klingelbergstrasse 82, Basel 4056, Switzerland ...

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Department of Advanced Materials Science, The University of Tokyo, Kashiwa, Chiba 277-8561, Japan ...