资讯

IEEE6 小时
The Impact of Nitrogen Engineering in Silicon Oxynitride Gate Dielectric on Negative-Bias ...
Abstract: Degradation of p-MOSFET parameters during negative-bias temperature instability (NBTI) stress is studied for different nitridation conditions of the silicon oxynitride (SiON) gate dielectric ...
IEEE3 天
A CMOS Envelope-Tracking Transmitter With an On-Chip Common-Gate Voltage Modulation Linearizer
Abstract: This letter presents a fully integrated CMOS envelope-tracking transmitter with an on-chip common-gate voltage modulation linearizer that achieves an average output power of 26/23.5 dBm with ...