Energy-tunable XPS reveals accurate surface chemistry of Ti3C2Tx MXenes, correcting for adsorbates and improving ...

The etching depth exhibits high linearity with respect to the applied cALE cycles, revealing a precise etching rate of a few angstroms per cALE cycle. The AFM measurement shows a low surface roughness ...

Discover everything there is to know about Reverse Tip Sample Scanning Probe Microscopy (RTS SPM) and its main applications.

Abstract: Considering the special effect of patterned r-plane sapphire substrate for the growth of nonpolar GaN, a model is proposed by introducing a modified Wulff- Joccodine method to identify the ...