EBSD is commonly performed in a scanning electron microscope (SEM) equipped with a specialized EBSD detector. This illustration depicts the detection geometry commonly used in Electron Backscatter ...

The combination of the high-resolution scanning electron microscope and its optimised detectors (EDX and EBSD) allows for highly flexible and swift investigation capabilities. With the help of 'charge ...

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EBSD spot analysis before ion milling ... This behavior is commonly observed in Atomic Resolution Transmission Electron Microscopy: as the energy of ions used to prepare a TEM sample increases ...

This technique is suitable for ceramic, beam-sensitive perovskite, or semiconductor materials that are difficult to analyze with conventional EBSD systems. This groundbreaking series leverages ...

The University of Glasgow is issuing a final call for abstract submissions for this year’s Electron Backscatter Diffraction ...

ZEISS EVO series combines high definition Scanning Electron Microscopy with high throughput ... configured for demanding imaging, EDS, WDS and EBSD applications. Robust stage options provide ...

Quick workflows on beam-sensitive samples: Vacuum load-lock and liquid nitrogen cold stage for quick workflows on beam-sensitive samples Real-time polishing method observation: such as an optical ...

Metallurgical and materials science studies can considerably benefit from directly observing specimen heating within the scanning electron microscope ... is perfect for electron backscatter ...