Using scanning electron microscopy (SEM), and energy dispersive X-ray spectroscopy (EDS), X-ray diffraction (XRD), and electrochemical impedance spectroscopy (EIS) the copper oxide thickness, ...

This study presents novel insights into the molecular nature of NOMs and their functionalities engaged in copper binding using Fourier transform ion cyclotron resonance mass spectrometry (FT-ICR-MS) ...

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