Fitting of full X-ray diffraction patterns is an effective method for quantifying abundances during X-ray diffraction (XRD) analyses. The method is based on the principal that the observed diffraction ...

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Figure 8 presents the X-ray Diffraction (XRD) pattern on the prepared samples. The peaks in Figure 8 are related to 111, 200, 220, 200, and 311 planes of hcp cobalt. Due to the very small size, cobalt ...

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We asked experts if regular exposure to low levels of radiation could be harmful to health. Credit...Joyce Lee for The New York Times Supported by By Melinda Wenner Moyer Q: It seems as if every ...