This article will explore various aspects of failure analysis methodologies in semiconductor and electronic device manufacturing, with a particular focus on the application of atomic force microscopy ...

Here, force spectra reveal the position and dynamics of a previously invisible transient site.

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Featuring a new ergonomic design and improved electronics, this scientific-grade microscope delivers atomic-scale resolution at a remarkably affordable price. The 5420 offers a simple cost ...

Without the need for a current, such an "atomic force microscope" (AFM) could reveal the structure of nonconductive materials such as proteins, organelles, and whole cells. Immediately thereafter, the ...

† Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, 230026, P. R. China ‡ i-Lab, Suzhou Institute of Nano-Tech and Nano-Bionics, ...

It is ideal for polymer, general surface characterization and materials applications The Agilent 5100 AFM/SPM microscope delivers atomic-scale resolution as well as direct video access to the scan ...

Defects significantly affect the electronic, chemical, mechanical, and optical properties of two-dimensional (2D) materials. Thus, it is critical to develop a method for convenient and reliable defect ...

scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM ...

Scientists create a biohybrid by combining E. coli with a metal-organic framework, enabling charge storage through microbial ...

This book, aimed at the 75 th anniversary of the Atomic Bombings and the end of World War II in the Pacific, is really out of its time and place. Author Tom Lewis (The Empire Strikes South) wants to ...