There is another way to investigate the domain of the very small: an atomic force microscope. Unlike their electron spewing brothers, they don’t require high voltages or hard vacuums.

and lateral force microscopy allow the user to access a variety of functions of the microscope. In addition to imaging, the AFM can measure the strength of inter-atomic forces and can sense the ...

The STM’s success sparked a flurry of innovations, leading to the development of the atomic force microscope (AFM) and other scanning probe technologies that could not only image atoms but also ...

The tip's position is meticulously adjusted using piezoelectric controls to maintain a constant tunneling current, allowing the device to image surfaces with atomic precision. Scanning Tunneling ...

Scanning tunneling microscope (STM) - using the tunneling current I between the outermost atom of a conducting probe within an atomic distance from a substrate to map out the sample topography and ...

Atoms inside the material follow a fixed ... The research team used noncontact atomic force microscopy (ncAFM) to analyze the ...