A comprehensive examination of oxide production on a silicon surface employing AFM is presented in research published in the MDPI journal micromachines. ... Temiryazev, A (2014) Pulse Force ...

Figure 1. Schematic illustration of Bias-Assisted AFM Nanolithography [4, 5]. Image Credit: Park Systems. Throughout this study, Park lithography software was utilized to develop and apply ...

Posted: Mar 16, 2009: High-speed AFM enables real-time nanofabrication (Nanowerk Spotlight) The operation principle of atomic force microscopy (AFM) is based on an atomically sharp tip, placed at the ...

In atomic force microscopy (AFM), tip quality depends mainly on the dimensions and shape of the probe, the durability of the tip apex, and the nature of the interaction between sample and probe. With ...

A new dynamic AFM sensor uses a U-shaped, silicon cantilever connected to a quartz-tuning fork (QTF). ... and surface roughness have to be controlled for best results. Thus, ...

Bennewitz’s team discovered that both single and bi–layers of graphene are much more slippery than bare silicon carbide. For example, when the AFM tip was pushed down onto the surface with a normal ...

However, instead of heating the entire sample, the researchers used a hot atomic force microscope (AFM) tip to convert very narrow ribbons, measuring just 12 nm across, into reduced graphene. The ...

A new technical paper titled “Electrically Controlled All-Antiferromagnetic Tunnel Junctions on Silicon with Large Room-Temperature Magnetoresistance” was published by researchers at Northwestern ...