The static measurements by AFM may not be as sensitive as interference methods 7 in detecting rapid, dynamic changes within the cytoskeleton of the cell. However, if the cytoskeleton remodelling ...

The atomic force microscope (AFM) was invented five years after the scanning tunnelling microscope (STM), but it has since become the most widely used form of scanning probe microscopy.

Follow Bruker and explore the latest applications of AFM in the semiconductor industry with a panel of experts. What are the recommended cantilevers for measuring the mechanical properties of ...

Cantilevers are located in a box in the AFM lab. There is a log sheet next to them. Facility users must record their use of tips. General purpose tapping mode cantilevers are available for $21 each.

Cantilevers are located in a box in the AFM lab. There is a log sheet next to them. Facility users must record their use of tips. General purpose tapping mode cantilevers are available for $21 each.

One of the most important acronyms in nanotechnology is AFM – Atomic Force Microscopy. This instrument has become the most widely used tool for imaging, measuring and manipulating matter at the ...

The CoreAFM is the outcome of smartly integrating the core components of AFM to achieve utmost flexibility and user-friendliness. The CoreAFM is set up to conduct AFM at its best, thanks to its ...