Go to the Mode Master. Select Offline Image. Click Browse in the AR Load Path Window to locate the directory you wish to use. If you were just imaging, the images you took during this session should ...

It is also used in measurements of surface and adhesion forces. The Veeco Dimension 3000 atomic force microscope (AFM) is used to analyze a variety of sample sizes and types. It can function in air or ...

Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...