Scanning Electron Microscope (SEM) and Electron Probe Microanalyzer (EPMA) Laboratory The Scanning Electron Microscope (SEM) and Electron Probe Microanalyzer (EPMA) Laboratory is open for use by those ...

FE-EPMA (JEOL JXA-iHP200F) FE-SEM (JEOL JSM 7100FT) WSEM (JEOL JSM 6010LA) Leica EM ACE600 sputter coater EMS 150T sputter coater ...

Sionex Corporation has announced that it will be exhibiting its microAnalyzer product to interested OEMs at the upcoming ISA 2006 EXPO in Houston, Texas. Designed for incorporation into OEM end-user ...

Electron microprobe analysis is a sensitive technique for non-destructive quantification of the chemical composition of in situ micrometer volumes of solid material (minerals, alloys, ceramics, glass, ...

Sionex Corporation has announced at the 15th International Society for Ion Mobility Spectrometry (ISIMS) meeting in Honolulu, HI, an Early Technology Access Program (ETAP) for its Sionex ...

JEOL, a leading manufacturer of electron microscopes for over fifty years, has introduced an advanced electron probe microanalyzer (EPMA) with a thermal field emission electron gun designed ...