If the product requires wafer level testing, then more hardware is needed. In addition to a manual test rig, I will also have been designing a probe card, which will connect to the ATE head with a ...

) is a $2.5 billion OEM of automated wafer probe cards and other testing devices used in the back-end portion of the semiconductor manufacturing process. FORM serves ...

presents the achievement in 3D/2.5D MEMS probe card development for WAT test (Wafer Acceptance Test, WAT) and provides users the positive effects on test efficiency and reliable results.

High parallelism is a key factor in reducing costs during wafer-level testing. Wafer testing is conducted using Automatic Test Equipment (ATE) along with test infrastructures such as the Prober ...

presents the achievement in 3D/2.5D MEMS probe card development for WAT test (Wafer Acceptance Test, WAT) and provides users the positive effects on test efficiency and reliable results. STAr Virgo ...

Slessor explained that probe-card demand is influenced by new design releases and associated wafer volumes, with low PC and ...