Wafer map: A graphical representation of defect locations across a semiconductor wafer. Convolutional Neural Network (CNN): A deep learning model ideal for image-based pattern recognition tasks.

Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise ...

As sub-10 nm high-volume manufacturing is becoming mainstream, reliable detection of various killer defects on patterned wafers becomes much more challenging and attracts increasing attention in ...

WiMi's successful development of semiconductor wafer defect detection technology through the use of digital holography will bring many benefits to the semiconductor manufacturing industry.

More information: Chen Tang et al, Wafer surface defect detection with enhanced YOLOv7, International Journal of Information and Communication Technology (2024). DOI: 10.1504/IJICT.2024.141433 ...

Applied Materials SEMVision™ H20 defect review system Applied Materials' SEMVision™ H20 system combines the industry’s most sensitive eBeam technology with advanced AI image recognition to ...

BEIJING, Aug. 31, 2023 /PRNewswire/ -- WiMi Hologram Cloud Inc. (NASDAQ: WIMI) ("WiMi" or the "Company"), a leading global Hologram Augmented Reality ("AR") Technology provider, today announced ...

--WiMi Hologram Cloud Inc., a leading global Hologram Augmented Reality Technology provider, today announced that an innovative detection technique based on digital holography has been developed ...

business. WiMi Developed Digital Holography-Based Semiconductor Wafer Defect Detection Technology. PUBLISHED ON August 31, 2023 12:00 PM ...