A new technical paper titled “Semi-Supervised Learning with Wafer-Specific Augmentations for Wafer Defect Classification” was published by researchers at Korea University. “Semi-supervised learning ...

Asymmetries in wafer map defects are usually treated as random production hardware defects. For example, asymmetric wafer defects can be caused by particles inadvertently deposited on a wafer during ...

The work may pave new avenues for the field of semiconductor wafer defect inspection. Prof. Jinlong Zhu and Prof. Shiyuan Liu said, “The ever-shrinking features and space on patterned wafers ...

WiMi's successful development of semiconductor wafer defect detection technology through the use of digital holography will bring many benefits to the semiconductor manufacturing industry.

TOKYO, Dec 6, 2023 - (JCN Newswire) - Hitachi High-Tech Corporation announced today the launch of the Hitachi Dark Field Wafer Defect Inspection System DI4600 – a new tool for inspecting ...

Traditionally, optical techniques are used to scan a wafer for potential defects, and then eBeam is deployed to better characterise ... At the most advanced nodes, optical inspection creates much ...

The usual way to spot defects on silicon wafers has been done manually, with human operators examining each wafer by eye. This is both time-consuming and error-prone due to the fine attention to ...