Electrostatic Force Microscopy (EFM) is a scanning probe microscopy technique that measures the electrostatic interactions between a conductive probe and a sample surface. EFM is a powerful tool for ...

Definition: Kelvin Probe Force Microscopy (KPFM), also known as Surface Potential Microscopy, is a cutting-edge scanning probe microscopy technique that measures the surface potential of materials at ...

Scanning probe microscopy images a sample by scanning a physical probe just above the surface ... bond-resolved atomic force microscopy. The orbital structure of charge density waves on a square ...