The atomic force microscope is a scanning probe system that measures the interatomic force between the tip of a silicon cantilever and the sample being studied. The Digital Instruments multimode ...

The roughness for the full image is already calculated and displayed, but a mask can be made to exclude certain areas from the roughness in the image. Click on the Mask Make button. This will make a ...

Right: Current through the film of the area inside the blue rectangle in the topography. (Image: Nanosurf) In C-AFM, a conductive AFM probe, typically made of silicon or silicon nitride and coated ...