The atomic force microscope (AFM) was invented five years after the scanning tunnelling microscope (STM), but it has since become the most widely used form of scanning probe microscopy.

SPM techniques share the common approach of scanning a probe over a specimen's surface to gather information. While STM provides unparalleled atomic-resolution images of conductive and semiconductive ...

metrological and high-resolution measurements for the most sophisticated materials research at the nanoscale in all STM and AFM modes. With the SmartSPM capable of zooming in from large up to 100 µm, ...

Four STM tips are offered as standard; optionally, any number of these probes can be positioned anywhere between one and four and can be transformed in vacuum to AFM-qPlus sensor for use on conductive ...

Swift SEM-guided probe is placed in a broad field of view, incorporated with uncompromised STM/AFM resolution. A fully built-in SEM is onboard RHK Technology’s well-established UHV AFM/STM. Proven ...