Atomic force microscopy is a subset of scanning probe microscopy. The Veeco Dimension 3000 operates in both tapping and contact modes, with capabilities of topographic and phase imaging, lateral force ...

The ultrasonic waves cause the sample to vibrate, and the AFM tip detects these vibrations as it scans across the surface. By analyzing the amplitude and phase of the detected vibrations, AFAM can map ...

The inherent modularity of the alpha300 R makes it possible to integrate Raman imaging with complementary imaging methods such as AFM, SNOM and ... The oil phase (green) is partially removed ...