The JEOL 1400 High Contrast Transmission Electron Microscope is a state-of-the-art imaging system designed for high-resolution transmission electron microscopy (TEM). This microscope features advanced ...

The JEOL JSM IT500 scanning electron microscope (SEM) is used for high-resolution imaging and qualitative X-ray microanalysis of conductive and non-conductive samples at a magnification range between ...

JEOL produced its first electron microscope in 1949, the year of the company’s establishment. Today, under the philosophy of aiming for the world’s most advanced technologies based on creative ...

The electron microscopes in the main suite are all fitted with digital image capture and energy dispersive X-ray systems for analysis of elemental composition and distribution. The most recent ...

grant by NSF in Summer 2014 to purchase a new electron microprobe, a JEOL JXA-8230 equipped with LaB6 electron gun (PIs K.H. Mahan, J.M. Allaz, and G.L. Farmer). This new instrument will replace the ...

Combined with JEOL's unique additive manufacturing technology, additive manufacturing innovation is developing at a rate never seen before. JEOL's electron beam metal AM machine can now efficiently ...

Scanning Electron Microscope (SEM) and Electron Probe Microanalyzer (EPMA ... Our new NSF-funded field-emission EPMA (JEOL JXA iHP200F) was the first to be installed in the U.S. and is equipped with 5 ...