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Nanoscale Electrical Characterization with AFM Technology
Use precise geolocation data and actively scan device characteristics for identification. This is done to store and access ...
The Scientist7 个月
Atomic Force Microscopy to See the Invisible
What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...