The roughness for the full image is already calculated and displayed, but a mask can be made to exclude certain areas from the roughness in the image. Click on the Mask Make button. This will make a ...

Atomic force microscopy (AFM) is a way to investigate the surface features of some materials. It works by “feeling” or “touching” the surface with an extremely small probe. This provides a ...

The study utilized AFM to assess the micro-roughness and multifractal characteristics of Cr films deposited on various substrates. The results showed that the substrate choice significantly ...

Atomic Force Microscopy,Bare Silicon,Buried Layer,Etching,Lithography Process,RMS Roughness,Reflection Coefficient,Silicon Substrate,Silicon Wafer,3D Images ...

full grid or wafer mapping support, tip-centering, and image-placement precision within tens of nanometers Easy and simple setup to align sample to probe and make alignment corrections to AFM ...

Bond Strength,Silicon Wafer,Activation Energy,Atomic Force Microscopy,Atomic Force Microscopy Data,Bond Quality,Buffered Oxide Etchant,Catalyst Support,Chemical Residues,Combustion Chamber,Combustion ...