Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

C-AFM allows researchers to simultaneously map the topography and local electrical properties of a sample, providing valuable insights into the structure-property relationships of nanomaterials and ...

Since its invention in 1986, AFM applications have expanded far beyond simple topographic imaging. AFM tips can be functionalized with a wide range of molecules and used for force-distance ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure AFSEM is an atomic force microscope (AFM ...

Figure 1: AFM techniques to characterize and manipulate biological systems on the nanometre scale. Molecular interactions make up the basic language of all biological processes. They determine how ...

It enables the study of electrochemical processes and reactions at the nanoscale, providing valuable insights into the relationship between surface topography, electrical properties, and chemical ...

Kanazawa University, observe the configuration of different dipeptides on graphite electrodes and the subsequent arrangement of catalytic hemin on them to get an idea of the factors affecting its ...

Multiple models for modulus fitting are included in the state-of-the-art batch processing options, thereby divulging surface topography at zero force using Contact Point Imaging (CPI). The interface ...

Atomic force microscopy is a subset of scanning probe microscopy. The Veeco Dimension 3000 operates in both tapping and contact modes, with capabilities of topographic and phase imaging, lateral force ...

AFM is also utilized for defect assessment and yield control, where accurate topographic imaging aids in identifying and categorizing faults. Several advancements have made AFM more suitable for ...

For high-performance materials research imaging tasks, the alpha300 A can be equipped with the Pulsed Force Mode, allowing local surface properties such as local adhesion or stiffness to be imaged ...