The AFSEM’s intuitive software makes system operation, measurement, and data analysis efficient and straightforward. For material and product analysis, multiple techniques are often important to ...

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The following properties make the BRR microscope a worldwide unique system: The AFM component of the BRR is equipped with a classical laser deflection detection, which has been adopted to allow a very ...

RHK Technology offers a solution in the form of the UHV probe positioning system. Swift SEM-guided probe is placed in a broad field of view, incorporated with uncompromised STM/AFM resolution. A fully ...