a hydrogen-terminated silicon surface. A procedure to obtain a passivated hydrogen-functionalized tip is defined and evolution of atomic force microscopy images at different tip elevations are shown.

A comprehensive examination of oxide production on a silicon surface with platinum-coated while scratching when given a tip bias and material removal using a diamond tip, employing AFM, is presented ...

To draw nanopatterns onto a silicon substrate, a Park NX10 AFM was utilized for AFM nanolithography. LFM imaging was performed after the lithography process to verify the successful fabrication of the ...

What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...

Scanning across the surface, the sharp tip follows the bumps and grooves formed by ... "High-speed scanning enables the tip to cover several hundred frames in the same time as it would take a ...

(Image: Nanosurf) In C-AFM, a conductive AFM probe, typically made of silicon or silicon nitride and coated with a thin metal layer (e.g., gold or platinum), is used to scan the sample surface. The ...

In silicon wafer and cell production, the surface of the wafer is usually given a texture of tiny pyramid shapes, which serve to reduce reflection and trap more light in the cell.

Realizing this potential requires AFM devices with simultaneous electrical writing and reading of information, which are also compatible with established silicon-based manufacturing. Recent ...