Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure AFSEM is an atomic force microscope (AFM ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure FusionScope is a user-friendly platform ...
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Testing Tensile Stress and Material FractureAFSEM ® combines the strengths of SEM and AFM with tensile stages by offering an AFM scanner capable of being inserted in most commercial SEMs, which then enables the correlative, in-situ ...
Swift SEM-guided probe is placed in a broad field of view, incorporated with uncompromised STM/AFM resolution. A fully built-in SEM is onboard RHK Technology’s well-established UHV AFM/STM. Proven ...
One of the most important acronyms in nanotechnology is AFM – Atomic Force Microscopy. This instrument has become the most widely used tool for imaging, measuring and manipulating matter at the ...
SPIP™ supports many microscope types including scanning probe microscopes (SPM, AFM, STM, SNOM, etc.), electron microscopes (SEM, TEM), interference microscopes, confocal microscopes, optical ...
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Imaging Techniques for Razor Blade Quality and Performance TestingAtomic Force Microscopy (AFM) can be used alongside SEM to provide comprehensive quantitative information on blade coating uniformity and curvature by gathering topographic information on the ...
A variety of nanomaterials samples systems will be characterized using laser scanning confocal microscopy (LSCM), scanning electron microscopy (SEM), transmission electron microscopy (TEM) and atomic ...
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