The stage can be fitted with an optical reference system for higher positioning precision ... The integration with high end optics facilitates an automated preselection of sample sites for AFM ...

It is also used in measurements of surface and adhesion forces. The Veeco Dimension 3000 atomic force microscope (AFM) is used to analyze a variety of sample sizes and types. It can function in air or ...

This novel atomic force microscopy (AFM) technique is completely changing ... above features a 60-micron scan of a polymer battery sample, revealing current variations across six orders of ...

It also serves as an ideal solution for companies considering AFM implementation before ... post-processing, a Rotation Stage for precise sample alignment in wafer-level packaging, and an Off ...

A full AFM system, with an unmatched small footprint, has been created by combining an advanced flexure-guided scanner, active vibration isolation table, XYZ sample stage, camera and airflow shielding ...

Park FX Large Sample AFM Series: From Left ... It is equipped with specialized features such as a Sliding Stage for long-range flatness measurements of copper pads in semiconductor post-processing ...