The atomic force microscope is a scanning probe system that measures the interatomic force between the tip of a silicon cantilever and the sample being studied. The Digital Instruments multimode ...

Figure 1: AFM techniques ... current standard gene-chip technology. Third, cantilever arrays are not expensive because they are microfabricated by standard low-cost silicon technology.

SEOUL, Korea – February 19, 2025 – Park Systems, a global leader in atomic force microscopy (AFM), has unveiled an expanded FX Large Sample AFM series at SEMICON Korea 2025. Building on the ...